AFM (Atomic Force Microscopy) is possibly the most versatile and powerful type of microscopy technology available for studying samples at the nanoscale. It is versatile because a budget atomic force microscope can not only image in three-dimensional topography, but it also provides various types of surface measurements to the needs of engineers and scientists. It is powerful because an AFM can easily generate images at atomic resolution with angstrom scale resolution height information, with minimum sample preparation. AFM Principle - Surface Sensing An AFM uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip causes the cantilever to deflect towards the surface. However, as the cantilever is brought even closer to the surface, such that the tip makes contact with it, increasingly repulsive force takes over and causes the cantilever to deflect away from the surface. -
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