An atomic force microscope (AFM) is a type of high resolution scanning probe microscope that has a resolution that you can measure in fractions of a nanometer. This scientific technology was pioneered in 1986 by Nobel Prize Winner Gerd Binnig along with Calvin Quate and Christoph Gerber. Atomic Force Microscopy One of the most important tools for imaging on the nanometer scale, AFM uses a cantilever with a sharp probe that scans the surface of the specimen. When the tip of the probe travels near to a surface, the forces between the tip and sample deflect the cantilever according to Hooke’s law. AFM will measure a number of different forces depending on the situation and the sample that you want to measure. As well as the forces, other microscopes can include a probe that performs more specialised measurements, such as temperature. The force deflects the cantilever, and this changes the reflection of a laser beam that shines on the top surface of the cantilever onto an array of photod
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